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Section Details
Keywords
bit error probability
bit error rate
information security
integrated circuit
machine learning
magnetorefractive effect
magnetostriction
mathematical model
mathematical modeling
modeling
nanocomposites
nanostructures
neural network
neural networks
noise immunity
objective function
piezoelectric effect
reliability
route
simulation
spline
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MIREA - Russian Technological University (RTU MIREA), M.V. Lomonosov Institute of Fine Chemical Technologies
Managing Editor: Galina D. Seredina
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e-mail: seredina@mirea.ru
