For citations:
Babenko V.P., Bityukov V.K., Kuznetsov V.V., Simachkov D.S. SIMULATION OF STATIC AND DYNAMIC LOSSES IN MOSFET KEYS. Russian Technological Journal. 2018;6(1):20-39. (In Russ.) https://doi.org/10.32362/2500-316X-2018-6-1-20-39
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About the Authors
Keywords
DC/DC converter
bit error probability
bit error rate
harmonic interference
information security
integrated circuit
machine learning
magnetostriction
mathematical model
mathematical modeling
modeling
nanocomposites
neural networks
noise immunity
objective function
optimization
piezoelectric effect
reliability
route
simulation
spline
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