Identification of knowledge sources for micro- and nanoelectronics technologies
https://doi.org/10.32362/2500-316X-2022-10-2-87-95
Abstract
Objectives. Over the past few decades, multiple knowledge management models have been developed by many research groups studying the innovation process in companies. However, these knowledge and information management models are rather general, and do not consider the dynamics and variability of technology development. This implies involving specific organizations in different types of knowledge generation activities. The paper aims to reveal the importance of a knowledge management system in micro- and nanoelectronics technologies as well as identify and systematize the sources of knowledge in the scientific and technical field.
Methods. In this paper, the method for analyzing the relationship between key business indicators of the companies is applied. The results are then represented in a causal loop diagram. The stakeholder analysis method is also used here.
Results. Three relevant trends in developing the knowledge management system for knowledge-intensive enterprises involved in micro- and nanoelectronics technologies are identified with respect to the social, commercial, and scientific and technical aspects in research organizations. The key sources of knowledge on micro- and nanoelectronics technologies include universities, institutions of the Russian Academy of Sciences, industry-specific institutions, customers, manufacturers, and consumers. Also, the authors consider digital twins to be a promising source of knowledge on micro- and nanoelectronics technologies.
Conclusions. The analysis of the technology life cycle curve using the example of micro- and nanoelectronics allows correlating single stages of this life cycle with specific activities during which new knowledge is generated. These activities include fundamental and applied research, requirements management, implementation in manufacturing, and operation analysis. For microelectronics, they correspond to the areas of emergence, peak of inflated expectations, trough of disillusionment, slope of enlightenment, and plateau of productivity on the technology life cycle curve.
About the Authors
A. A. Sharapov
Molecular Electronics Research Institute; Moscow Institute of Physics and Technology
Russian Federation
Russian Federation
Andrey A. Sharapov, Research Scientist; Postgraduate Student, Phystech School of Electronics, Photonics and Molecular Physics, and Master Student, Higher School of Systems Engineering
6/1, ul. Akademika Valieva, Zelenograd, Moscow, 124460
9, Institutskii per., Dolgoprudny, Moscow oblast, 141701
ResearcherID ABC-7256-2021
E. S. Gornev
Molecular Electronics Research Institute
Russian Federation
Russian Federation
Evgeny S. Gornev, Corresponding Member of the Russian Academy of Sciences, Dr. Sci. (Eng.), Professor, Deputy Head of the Priority Technological Area for Electronic Technologies
6/1, ul. Akademika Valieva, Zelenograd, Moscow, 124460
Scopus Author ID 6507763230
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Supplementary files
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1. Positive feedback loops with respect to business processes in the social, commercial, and scientific and technical aspects formed when implementing the corporate knowledge management system for microelectronics technologies | |
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| Type | Исследовательские инструменты | |
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Indexing metadata ▾ | |
- The key sources of knowledge on micro- and nanoelectronics technologies include universities, institutions of the Russian Academy of Sciences, industry-specific institutions, customers, manufacturers, and consumers.
- The knowledge management system is aimed at solving problems of the social, commercial, and scientific and technical aspects of the company’s activities in micro- and nanoelectronics.
- Fundamental and applied research, requirements management, manufacturing, and operation correspond to main sections of the life cycle curve for the considered technologies.
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Sharapov A.A., Gornev E.S. Identification of knowledge sources for micro- and nanoelectronics technologies. Russian Technological Journal. 2022;10(2):87-95. https://doi.org/10.32362/2500-316X-2022-10-2-87-95
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