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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">mireabulletin</journal-id><journal-title-group><journal-title xml:lang="ru">Russian Technological Journal</journal-title><trans-title-group xml:lang="en"><trans-title>Russian Technological Journal</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2782-3210</issn><issn pub-type="epub">2500-316X</issn><publisher><publisher-name>RTU MIREA</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32362/2500-316X-2024-12-4-23-39</article-id><article-id custom-type="edn" pub-id-type="custom">DRCIUV</article-id><article-id custom-type="elpub" pub-id-type="custom">mireabulletin-960</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ИНФОРМАЦИОННЫЕ СИСТЕМЫ. ИНФОРМАТИКА. ПРОБЛЕМЫ ИНФОРМАЦИОННОЙ БЕЗОПАСНОСТИ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>INFORMATION SYSTEMS. COMPUTER SCIENCES. ISSUES OF INFORMATION SECURITY</subject></subj-group></article-categories><title-group><article-title>Выявление аппаратных уязвимостей цифровых устройств на основе систем сканирования и полунатурного моделирования</article-title><trans-title-group xml:lang="en"><trans-title>Identification of digital device hardware vulnerabilities based on scanning systems and semi-natural modeling</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-6264-1231</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Певцов</surname><given-names>Е. Ф.</given-names></name><name name-style="western" xml:lang="en"><surname>Pevtsov</surname><given-names>E. F.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Певцов Евгений Филиппович, к.т.н., директор структурного подразделения «Центр проектирования интегральных схем, устройств наноэлектроники и микросистем»</p><p>119454, Москва, пр-т Вернадского, д. 78</p></bio><bio xml:lang="en"><p>Evgeniy F. Pevtsov, Cand. Sci. (Eng.), Director of Center for the Design of Integrated Circuits, Nanoelectronics Devices and Microsystems</p><p>78, Vernadskogo pr., Moscow, 119454</p><p>Scopus Author ID 6602652601. ResearcherID M-2709-2016</p></bio><email xlink:type="simple">pevtsov@mirea.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-3519-6683</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Деменкова</surname><given-names>Т. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Demenkova</surname><given-names>T. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Деменкова Татьяна Александровна, к.т.н., доцент, кафедра вычислительной техники, Институт информационных технологий</p><p>119454, Россия, Москва, пр-т Вернадского, д. 78</p><p>Scopus Author ID 57192958412, ResearcherID AAB-3937-2020</p></bio><bio xml:lang="en"><p>Tatyana A. Demenkova, Cand. Sci. (Eng.), Associated Professor, Computer Technology Department, Institute of Information Technologies</p><p>78, Vernadskogo pr., Moscow, 119454</p><p>Scopus Author ID 57192958412, ResearcherID AAB-3937-2020</p></bio><email xlink:type="simple">demenkova@mirea.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-1471-9043</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Индришенок</surname><given-names>А. О.</given-names></name><name name-style="western" xml:lang="en"><surname>Indrishenok</surname><given-names>A. О.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Индришенок Александр Олегович, аспирант, кафедра вычислительной техники, Институт информационных технологий</p><p>119454, Москва, пр-т Вернадского, д. 78</p></bio><bio xml:lang="en"><p>Alexander O. Indrishenok, Postgraduate Student, Computer Technology Department, Institute of Information Technologies</p><p>78, Vernadskogo pr., Moscow, 119454</p></bio><email xlink:type="simple">indrishenoksasha@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-1118-6608</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Филимонов</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Filimonov</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Филимонов Владимир Викторович, старший преподаватель, кафедра физики и технической механики, Институт перспективных технологий и индустриального программирования</p><p>119454, Россия, Москва, пр-т Вернадского, д. 78</p><p>Scopus Author ID 7102525379</p></bio><bio xml:lang="en"><p>Vladimir V. Filimonov, Senior Lecturer, Department of Physics and Technical Mechanics, Institute for Advanced Technologies and Industrial Programming</p><p>78, Vernadskogo pr., Moscow, 119454</p><p>Scopus Author ID 7102525379</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>ФГБОУ ВО «МИРЭА – Российский технологический университет»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>MIREA – Russian Technological University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>05</day><month>08</month><year>2024</year></pub-date><volume>12</volume><issue>4</issue><elocation-id>23–39</elocation-id><permissions><copyright-statement>Copyright &amp;#x00A9; Певцов Е.Ф., Деменкова Т.А., Индришенок А.О., Филимонов В.В., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Певцов Е.Ф., Деменкова Т.А., Индришенок А.О., Филимонов В.В.</copyright-holder><copyright-holder xml:lang="en">Pevtsov E.F., Demenkova T.A., Indrishenok A.О., Filimonov V.V.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.rtj-mirea.ru/jour/article/view/960">https://www.rtj-mirea.ru/jour/article/view/960</self-uri><abstract><p>Цели. Развитие вычислительной техники и информационных систем требует рассмотрения вопросов их безопасности, различных методов обнаружения аппаратных уязвимостей цифровых компонентов устройств и защиты от несанкционированного доступа. Важным аспектом данных проблем является исследование существующих методов на возможность и способность выявить аппаратные ошибки или произвести поиск ошибок на соответствующих моделях. Цель работы – разработка подходов, инструментов и технологии для обнаружения уязвимостей в аппаратном обеспечении на ранней стадии проектирования, создание методики их обнаружения и оценки риска, рекомендаций по обеспечению безопасности на всех этапах процесса разработки вычислительных систем.Методы. Использованы методы полунатурного моделирования, сравнения и выявления аппаратных уязвимостей, стресс-тестирования для выявления уязвимостей.Результаты. Предложены методы обнаружения и защиты от аппаратных уязвимостей, являющихся критически важным аспектом в обеспечении безопасности вычислительных систем. Для обнаружения уязвимостей в аппаратном обеспечении использованы методы сканирования портов, анализа протоколов связи и диагностики устройств. Определены возможные места нахождения аппаратных уязвимостей, их вариации, описаны атрибуты аппаратных уязвимостей и риски. Для обнаружения уязвимостей в аппаратном обеспечении на ранней стадии проектирования разработан специальный стенд полунатурного моделирования. Предложен алгоритм сканирования с использованием протокола Remote Bitbang, который позволяет передавать данные между OpenOCD и подключенным к отладочному порту устройством. На основе управления сканированием разработан метод верификации, реализующий сравнение поведенческой модели с эталоном. Приведены рекомендации по обеспечению безопасности на всех этапах процесса разработки вычислительных систем.Выводы. В данной работе предложены новые технические решения для обнаружения уязвимостей в аппаратном обеспечении, основанные на таких методах, как сканирование системы на программируемой логической интегральной схеме, полунатурное моделирование, верификация по виртуальной модели, анализ протоколов связи и диагностика устройств. Применение разработанных алгоритмов и способов позволит разработчикам предпринять необходимые меры по устранению аппаратных уязвимостей и предотвращению возможных вредоносных воздействий на всех этапах процесса проектирования устройств вычислительной техники и информационных систем. </p></abstract><trans-abstract xml:lang="en"><p>Objectives. The development of computer technology and information systems requires the consideration of issues of their security, various methods for detecting hardware vulnerabilities of digital device components, as well as protection against unauthorized access. An important aspect of this problem is to study existing methods for the possibility and ability to identify hardware errors or search for errors on the corresponding models. The aim of this work is to develop approaches, tools and technology for detecting vulnerabilities in hardware at an early design stage, and to create a methodology for their detection and risk assessment, leading to recommendations for ensuring security at all stages of the computer systems development process.Methods. Methods of semi-natural modeling, comparison and identification of hardware vulnerabilities, and stress testing to identify vulnerabilities were used.Results. Methods are proposed for detecting and protecting against hardware vulnerabilities: a critical aspect in ensuring the security of computer systems. In order to detect vulnerabilities in hardware, methods of port scanning, analysis of communication protocols and device diagnostics are used. The possible locations of hardware vulnerabilities and their variations are identified. The attributes of hardware vulnerabilities and risks are also described. In order to detect vulnerabilities in hardware at an early design stage, a special semi-natural simulation stand was developed. A scanning algorithm using the Remote Bitbang protocol is proposed to enable data to be transferred between OpenOCD and a device connected to the debug port. Based on scanning control, a verification method was developed to compare a behavioral model with a standard. Recommendations for ensuring security at all stages of the computer systems development process are provided.Conclusions. This paper proposes new technical solutions for detecting vulnerabilities in hardware, based on methods such as FPGA system scanning, semi-natural modeling, virtual model verification, communication protocol analysis and device diagnostics. The use of the algorithms and methods thus developed will allow developers to take the necessary measures to eliminate hardware vulnerabilities and prevent possible harmful effects at all stages of the design process of computer devices and information systems.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>аппаратная уязвимость</kwd><kwd>цифровые компоненты</kwd><kwd>полунатурное моделирование</kwd><kwd>диагностика</kwd><kwd>сканирование</kwd><kwd>верификация</kwd></kwd-group><kwd-group xml:lang="en"><kwd>hardware vulnerability</kwd><kwd>digital components</kwd><kwd>half-life modeling</kwd><kwd>diagnostics</kwd><kwd>scanning</kwd><kwd>verification</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при поддержке Министерства науки и высшего образования РФ (Государственное задание для университетов № ФГФЗ-2023-0005) и с применением оборудования Центра коллективного пользования РТУ МИРЭА (соглашение от 01.09.2021 № 075-15-2021-689, уникальный идентификационный номер 2296.61321Х0010).</funding-statement><funding-statement xml:lang="en">This work was supported by the Ministry of Science and Higher Education of the Russian Federation (State task for universities No. FGFZ-2023-0005) and using the equipment of the Center for Collective Use of RTU MIREA (agreement dated September 01, 2021, No. 075-15-2021-689, unique identification number 2296.61321X0010).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Smetana D. 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