<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">mireabulletin</journal-id><journal-title-group><journal-title xml:lang="ru">Russian Technological Journal</journal-title><trans-title-group xml:lang="en"><trans-title>Russian Technological Journal</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2782-3210</issn><issn pub-type="epub">2500-316X</issn><publisher><publisher-name>RTU MIREA</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32362/2500-316X-2019-7-4-71-80</article-id><article-id custom-type="elpub" pub-id-type="custom">mireabulletin-165</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МИКРО- И НАНОЭЛЕКТРОНИКА. ФИЗИКА КОНДЕНСИРОВАННОГО СОСТОЯНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MICRO- AND NANOELECTRONICS. CONDENSED MATTER PHYSICS</subject></subj-group></article-categories><title-group><article-title>Комплексный показатель преломления титаната стронция в терагерцовом диапазоне частот</article-title><trans-title-group xml:lang="en"><trans-title>Complex Refractive Index of Strontium Titanate in the Terahertz Frequency Range</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-3013-8655</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Билык</surname><given-names>В. Р.</given-names></name><name name-style="western" xml:lang="en"><surname>Bilyk</surname><given-names>V. R.</given-names></name></name-alternatives><bio xml:lang="ru"><p>аспирант кафедры наноэлектроники Физико-технологического института ; стажер-исследователь специализированной учебно-научной лаборатории сверхбыстрой динамики ферроиков кафедры наноэлектроники ФТИ </p><p>119454, Россия, Москва, пр-т Вернадского, д. 78</p><p>Scopus Author ID: 57194048515</p><p>ResearcherID: N-9662-2015, https://orcid.org/</p></bio><bio xml:lang="en"><p>Postgraduate Student of the Chair of Nanoelectronics, Institute of Physics and Technology; researcher, Laboratory of UltrafastDynamics of Ferroics of the Chair of Nanoelectronics</p><p>78, Vernadskogo pr., Moscow 119454, Russia</p><p>Scopus Author ID: 57194048515</p><p>ResearcherID: N-9662-2015</p></bio><email xlink:type="simple">vrbilyk@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-9523-355X</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Гришунин</surname><given-names>К. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Grishunin</surname><given-names>K. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>аспирант кафедры наноэлектроники Физико-технологического института</p><p>Scopus Author ID: 56968091600</p><p>ResearcherID: Q-1005-2017</p><p>119454, Россия, Москва, пр-т Вернадского, д. 78</p></bio><bio xml:lang="en"><p>Postgraduate Student of the Chair of Nanoelectronics, Institute of Physics and Technology</p><p>78, Vernadskogo pr., Moscow 119454, Russia</p><p>Scopus Author ID: 56968091600</p><p>ResearcherID: Q-1005-2017</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>ФГБОУ ВО «МИРЭА – Российский технологический университет» (РТУ МИРЭА)</institution><country>Россия</country></aff><aff xml:lang="en"><institution>MIREA – Russian Technological University (RTU MIREA)</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2019</year></pub-date><pub-date pub-type="epub"><day>10</day><month>08</month><year>2019</year></pub-date><volume>7</volume><issue>4</issue><fpage>71</fpage><lpage>80</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Билык В.Р., Гришунин К.А., 2019</copyright-statement><copyright-year>2019</copyright-year><copyright-holder xml:lang="ru">Билык В.Р., Гришунин К.А.</copyright-holder><copyright-holder xml:lang="en">Bilyk V.R., Grishunin K.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.rtj-mirea.ru/jour/article/view/165">https://www.rtj-mirea.ru/jour/article/view/165</self-uri><abstract><p>Современное развитие терагерцовой спектроскопии во временной области (THz-TDS) позволяет проводить более точные и достоверные измерения диэлектрических свойств по сравнению с традиционной инфракрасной спектроскопией с использованием некогерентного источника света. Широкополосная THz-TDS является мощным инструментом для определения действительной и мнимой частей комплексной диэлектрической проницаемости при прохождении ТГц-излучения, которая позволяет определять параметры мягких мод в сегнетоэлектриках. В данной работе методом терагерцовой спектроскопии с временным разрешением исследована зависимость комплексного показателя преломления монокристаллического квантового параэлетрика титаната стронция в терагерцовом диапазоне частот от 0.3 до 1.3 ТГц. Показано, что низкочастотный терагерцовый отклик материала обусловлен доминированием мягкой фононной моды TO1. Измеренные экспериментальные зависимости показали хорошее сходство с теоретическими кривыми, полученными из анализа модели осциллятора Лоренца для комплексной диэлектрической проницаемости титаната стронция. Результаты работы важны для понимания принципиальной возможности возбуждения параметра порядка в сегнетоэлектрических материалах и могут быть использованы для создания энергоэффективных устройств памяти со скоростью записи информации, близкой к теоретическому пределу.</p></abstract><trans-abstract xml:lang="en"><p>The recent progress in terahertz time-domain spectroscopy enables the accurate and reliable measurements of dielectric properties in comparison with the traditional far-infrared spectroscopy using an incoherent light source. The broadband THz-TDS is a powerful tool to determine the real and imaginary parts of a complex dielectric constant by the transmission which allows to detect the parameters of the soft modes in ferroelectrics. In this work, the terahertz time-domain spectroscopy was used to investigate the dependence of the complex refractive index of a single-crystal quantum paraelectric strontium titanate in the terahertz frequency range from 0.3 to 2 THz. It was shown that the low-frequency terahertz response of the material is determined by the soft phonon mode TO1. The measured experimental dependences showed a good agreement with the theoretical curves obtained from the analysis of the Lorentz oscillator model for the complex dielectric constant of strontium titanate. The obtained results are necessary for understanding the principle of possibility to manipulate the order parameter in ferroelectric materials and can be used to create energy-efficient memory devices with a speed of recording information close to the theoretical limit.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>терагерцовое излучение</kwd><kwd>с егнетоэлектрик</kwd><kwd>терагерцовая спектроскопия</kwd></kwd-group><kwd-group xml:lang="en"><kwd>terahertz radiation</kwd><kwd>ferroelectricity</kwd><kwd>terahertz spectroscopy</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при финансовой поддержке Российского фонда фундаментальных исследований (грант № 18-32-00487).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Barker A.S., Tinkham M. Far-infrared ferroelectric vibration mode in SrTiO3 // Phys. Rev. 1962. 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