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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">mireabulletin</journal-id><journal-title-group><journal-title xml:lang="ru">Russian Technological Journal</journal-title><trans-title-group xml:lang="en"><trans-title>Russian Technological Journal</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2782-3210</issn><issn pub-type="epub">2500-316X</issn><publisher><publisher-name>RTU MIREA</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32362/2500-316X-2019-7-3-59-68</article-id><article-id custom-type="elpub" pub-id-type="custom">mireabulletin-156</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МИКРО- И НАНОЭЛЕКТРОНИКА. ФИЗИКА КОНДЕНСИРОВАННОГО СОСТОЯНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MICRO- AND NANOELECTRONICS. CONDENSED MATTER PHYSICS</subject></subj-group></article-categories><title-group><article-title>Особенности моделирования магниторефрактивного эффекта в многослойных металлических наноструктурах</article-title><trans-title-group xml:lang="en"><trans-title>Features of Modeling of the Magnetorefractive Effect in Multilayered Metal Nanostructures</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мокрушина</surname><given-names>А. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Mokrushina</surname><given-names>A. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>магистрант первого курса кафедры наноэлектроники Физикотехнологического института</p><p>119454, Россия, Москва, пр-т Вернадского, д. 78</p></bio><bio xml:lang="en"><p>Master Student of the Chair of Nanoelectronics, Physics and Technology Institute</p><p>78, Vernadskogo pr., Moscow 119454, Russia</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Юрасов</surname><given-names>А. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Yurasov</surname><given-names>A. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>доктор физико-математических наук, доцент, профессор кафедры наноэлектроники Физико-технологического института</p><p>119454, Россия, Москва, пр-т Вернадского, д. 78</p></bio><bio xml:lang="en"><p>D.Sc. (Physics and Mathematics), Docent, Professor of the Chair of Nanoelectronics, Physics and Technology Institute</p><p>78, Vernadskogo pr., Moscow 119454, Russia</p></bio><email xlink:type="simple">alexey_yurasov@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>МИРЭА – Российский технологический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>MIREA – Russian Technological University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2019</year></pub-date><pub-date pub-type="epub"><day>07</day><month>06</month><year>2019</year></pub-date><volume>7</volume><issue>3</issue><fpage>59</fpage><lpage>68</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Мокрушина А.А., Юрасов А.Н., 2019</copyright-statement><copyright-year>2019</copyright-year><copyright-holder xml:lang="ru">Мокрушина А.А., Юрасов А.Н.</copyright-holder><copyright-holder xml:lang="en">Mokrushina A.A., Yurasov A.N.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.rtj-mirea.ru/jour/article/view/156">https://www.rtj-mirea.ru/jour/article/view/156</self-uri><abstract><p>Магниторефрактивный эффект (МРЭ) важен и интересен и с фундаментальной, и с практической точки зрения. Данный эффект заключается в изменении коэффициента отражения или прохождения электромагнитной волны от намагниченных структур, обладающих эффектами магнитосопротивления. Это может быть и гигантское, и туннельное, и колоссальное магнитосопротивление в зависимости от типа структуры. МРЭ наиболее ярко проявляется в ИК-области спектра и может достигать десятки процентов. Он характеризуется однозначной зависимостью от величины магнитосопротивления. В данной статье рассматриваются особенности МРЭ в многослойных металлических наноструктурах, обладающих гигантским магнитосопротивлением. Проведено исследование МРЭ с использованием модели, связывающей данный эффект с магнитосопротивлением, а также в рамках модели с учетом спин-зависящего рассеяния. Последняя модель в более ранних работах позволила хорошо описать качественно, а в отдельных случаях и количественно, ряд экспериментальных данных. Предложенный нами учет частотной зависимости сопротивления позволил улучшить первую модель и получить принципиально новый результат: надежное качественное и количественное описание величины эффекта. В статье отмечена ключевая возможность применения магниторефрактивного эффекта как бесконтактного метода исследования наноструктур, метода неразрушающего контроля любых элементов электроники. Проведено также сравнение с экспериментальными данными, продемонстрировавшее возможность эффективного описания связи МРЭ и магнитосопротивления в рамках двух рассмотренных моделей.</p></abstract><trans-abstract xml:lang="en"><p>The magnetorefractive effect (MRE) is important and interesting from both fundamental and practical points of view. This effect consists in a change in the reflection coefficient or the passage of an electromagnetic wave from magnetized structures with magnetoresistance effects. It can be giant, tunnel and colossal magnetoresistance depending on the type of structure. MRE is most clearly manifested in the IR region of the spectrum and can reach tens of percent. It is possible to show its unambiguous dependence on the magnitude of the magnetoresistance. This article discusses the features of MRE in multilayer metal nanostructures with giant magnetoresistance. The MRE simulation is carried out using a model that relates this effect to magnetoresistance, as well as in the framework of the model taking into account spin-dependent scattering. The last model in earlier works allowed describing a number of experimental data well qualitatively and in some places quantitatively. In this paper, taking into account the frequency dependence of the resistance allowed us to improve the first model, which allowed us to obtain a good qualitative and quantitative description of the effect value – this is a fundamentally new result. The article highlighted the key opportunity for the application of magnetorefractive effect as a contactless method to study nanostructures, a method of nondestructive testing of all electronic components. A comparison with experimental data is also made. A good description is demonstrated in the framework of the two models considered, which can effectively describe the relationship between MRE and magnetoresistance.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>наноструктуры</kwd><kwd>магниторефрактивный эффект</kwd><kwd>магнитоотражение</kwd><kwd>магнитопропускание</kwd><kwd>магнитосопротивление</kwd><kwd>спин-зависящее рассеяние</kwd></kwd-group><kwd-group xml:lang="en"><kwd>nanostructures</kwd><kwd>magnetorefractive effect</kwd><kwd>magnetoreflection</kwd><kwd>magnetotransmission</kwd><kwd>magnetoresistance</kwd><kwd>spin-dependent scattering</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Гороховский А.В. Композитные наноматериалы. Cаратов: Изд-во СГТУ, 2008. 68 с.</mixed-citation><mixed-citation xml:lang="en">Gorokhovsky А.V. Composite Nanomaterials. Saratov: SGTU Publ. 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