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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">mireabulletin</journal-id><journal-title-group><journal-title xml:lang="ru">Russian Technological Journal</journal-title><trans-title-group xml:lang="en"><trans-title>Russian Technological Journal</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2782-3210</issn><issn pub-type="epub">2500-316X</issn><publisher><publisher-name>RTU MIREA</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32362/2500316X-2025-13-1-122-135</article-id><article-id custom-type="edn" pub-id-type="custom">OABDBH</article-id><article-id custom-type="elpub" pub-id-type="custom">mireabulletin-1079</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>АНАЛИТИЧЕСКОЕ ПРИБОРОСТРОЕНИЕ И ТЕХНОЛОГИИ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ANALYTICAL INSTRUMENT ENGINEERING AND TECHNOLOGY</subject></subj-group></article-categories><title-group><article-title>Шумовые свойства предварительного усилителя для инфракрасного фотоприемника на основе HgCdTe</article-title><trans-title-group xml:lang="en"><trans-title>Noise properties of preamplifier to be used with LN2-cooled HgCdTe photodetector</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-0547-3785</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Казанцев</surname><given-names>Д. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Kazantsev</surname><given-names>Dmitry V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Казанцев Дмитрий Всеволодович, д.ф.-м.н., старший научный сотрудник; профессор, факультет физики,</p><p>119991, Москва, Ленинский пр-т, д. 53; </p><p>101000, Москва, Старая Басманная ул., д. 21/5.</p><p>Scopus AuthorID: 6603178750.</p></bio><bio xml:lang="en"><p>Dmitry V. Kazantsev, Dr. Sci. (Phys.-Math.), Senior Researcher; Professor, Faculty of Physics,</p><p>53, Leninskii pr., Moscow, 119991; </p><p>21/5, Staraya Basmannaya ul., Moscow, 101000.</p><p>Scopus AuthorID: 6603178750.</p></bio><email xlink:type="simple">kaza@itep.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0004-2019-3310</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Казанцева</surname><given-names>Е. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Kazantseva</surname><given-names>Elena A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Казанцева Елена Адольфовна, старший преподаватель, кафедра высшей математики, Институт кибербезопасности и цифровых технологий,</p><p>119454, Москва, пр-т Вернадского, д. 78. </p><p>Scopus AuthorID: 57219932826.</p></bio><bio xml:lang="en"><p>Elena A. Kazantseva, Senior Lecturer, Higher Mathematics Department, Institute of Cybersecurity and Digital Technologies, </p><p>78, Vernadskogo pr., Moscow, 119454.</p><p>Scopus AuthorID: 57219932826.</p></bio><email xlink:type="simple">kanele19@gmail.com</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>ФГБУН «Физический институт имени П.Н. Лебедева Российской академии наук» (ФИАН); Национальный исследовательский университет «Высшая школа экономики»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>P.N. Lebedev Physical Institute of the Russian Academy of Sciences;  HSE University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>ФГБОУ ВО «МИРЭА – Российский технологический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>MIREA – Russian Technological University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>05</day><month>02</month><year>2025</year></pub-date><volume>13</volume><issue>1</issue><fpage>122</fpage><lpage>135</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Казанцев Д.В., Казанцева Е.А., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Казанцев Д.В., Казанцева Е.А.</copyright-holder><copyright-holder xml:lang="en">Kazantsev D.V., Kazantseva E.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.rtj-mirea.ru/jour/article/view/1079">https://www.rtj-mirea.ru/jour/article/view/1079</self-uri><abstract><sec><title>Цели</title><p>Цели. Фоторезисторы на основе твердого раствора кадмий-ртуть-теллур (КРТ) применяются в инфракрасной (ИК) технике более 60 лет и в зависимости от композиции Hg1−xCdxTe имеют диапазон чувствительности в области длин волн от 1 до 15 мкм. Сопротивление светочувствительных КРТ-элементов составляет (в зависимости от площади) десятки Ом, и термодинамически ожидаемый шум Найквиста составляет менее 1 нВ/√Гц для такого резистора. Современные полупроводниковые технологии обеспечивают высокое качество как фотоприемных устройств, так и входных каскадов микросхем для усиления сигнала с них. Целью работы является исследование шумовых свойств разработанного электронного блока, предназначенного для совместной работы с КРТ-фотоприемником, охлаждаемым жидким азотом.</p></sec><sec><title>Методы</title><p>Методы. Для измерения и накопления шумовых спектров сигнала в диапазоне частот 0–1 МГц использована микропроцессорная плата аналогового ввода-вывода P25M производства Innovative, Inc. (США). Плата, на которой имеются четыре 16-битовых аналого-цифровых преобразователя с частотой до 25 МГц, управляющая ими программируемая логическая интегральная схема Spartan-3, процессор TMS320C6713 и оперативная память, передает собранные цифровые данные в материнскую плату через общий для них слот PCI-X. Спектры принятых данных вычислялись с помощью алгоритма быстрого преобразования Фурье с последующим усреднением квадрата амплитуды для всех спектральных составляющих.</p></sec><sec><title>Результаты</title><p>Результаты. Измерены спектры плотности шума первого каскада (ADA4898-2), второго каскада (AD8034) и источников тока смещения (AD8397 и LT3009). Обнаружено, что спектральная плотность шумов входа операционного усилителя ADA4898-2 сравнима с найквистовым (термодинамически ожидаемым) шумом резистора 20–100 Ом, соответствующего сопротивлению светочувствительного элемента. Это означает, что выбранный операционный усилитель идеально подходит для решения обсуждаемой технической задачи. Обнаружено также, что спектр шумов микросхем стабилизаторов напряжения и тока LT3009, ADR510 содержит заметную дрейфовую составляющую со спектральной плотностью вида 1/f α (f – частота, α ≈ 1).</p></sec><sec><title>Выводы</title><p>Выводы. Показано, что спектральная плотность шумов электронных компонентов, приведенная ко входу устройства, в несколько раз ниже плотности шумов использованного фотоприемника.</p></sec></abstract><trans-abstract xml:lang="en"><sec><title>Objectives</title><p>Objectives. Photoresistors based on a solid solution of mercury–cadmium–tellurium (MCT) have been used in infrared (IR) technology for over 60 years. They can have a sensitivity range in the wavelength region from 1 μm to 15 μm, depending on Hg1−xCdxTe composition. The resistance of photosensitive MCT elements is (depending on their area) tens of Ohms, and for such a resistor the thermodynamically expected Nyquist noise is less than 1 nV/√Hz. Modern semiconductor technologies ensure a high level of quality of both photodetectors and input stages of integrated circuits for amplifying the signal from them. The aim of this work is to study the noise properties of the electronic unit developed for joint operation with a liquid nitrogen cooled MCT-photodetector.</p></sec><sec><title>Methods</title><p>Methods. An analog input-output digital signal processor card P25M (Innovative, Inc., USA) was used to measure and accumulate the noise spectra of the signal in the frequency range 0–1 MHz. The card has four 16-bit ADCs of sampling rate up to 25MSpS, a Spartan-3 field-programmable gate array controlling them, a TMS320C6713 processor, and RAM, in order to transmit the collected digital data to the motherboard through a common PCI-X slot. The spectra of the received data were calculated using the fast Fourier transform algorithm with subsequent averaging of the square of the amplitude for all spectral components.</p></sec><sec><title>Results</title><p>Results. The noise properties of comparatively modern integrated circuits currently used for this task were considered. The noise density spectra of the first stage (ADA4898-2), the second stage (AD8034), and bias current sources (AD8397 and LT3009) were measured. It was found that the spectral density of the input noise of the operational amplifier ADA4898-2 is comparable to the Nyquist (thermodynamically expected) noise of a 20–100-Ohm resistor corresponding to the resistance of the photosensitive element. This means that the selected operational amplifier is ideal for resolving the technical problem discussed herein. Meanwhile, it was also established that the noise spectrum of the LT3009, ADR510 voltage and current stabilizer integrated circuits contains a noticeable drift component with a spectral density of “pink noise” 1/f α (f – frequency, α ≈ 1).</p></sec><sec><title>Conclusions</title><p>Conclusions. It was shown that the spectral noise density of the electronic components, reduced to the input of the device, is several times lower than the noise density of the photodetector used.</p></sec></trans-abstract><kwd-group xml:lang="ru"><kwd>ИК-фотоприемник</kwd><kwd>КРТ-приемник</kwd><kwd>малошумящая аппаратура</kwd><kwd>входные каскады</kwd><kwd>аналоговая электроника</kwd></kwd-group><kwd-group xml:lang="en"><kwd>IR-photodetector</kwd><kwd>MCT-photodetector</kwd><kwd>low-noise electronics</kwd><kwd>input stages</kwd><kwd>analog electronics</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Norton P. HgCdTe infrared detectors. Opto-Electron. Rev. 2002;10(3):159–174.</mixed-citation><mixed-citation xml:lang="en">Norton P. HgCdTe infrared detectors. Opto-Electron. 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